Publications by the researcher in collaboration with PEDRO LOPEZ MARTIN (4)


  1. I ON Degradation in Si Devices in Harsh Radiation Environments: Modeling of Damage-Dopant Interactions

    Proceedings of the 2018 12th Spanish Conference on Electron Devices, CDE 2018


  1. Atomistic modeling of dopant implantation, diffusion, and activation

    Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol. 24, Núm. 5, pp. 2432-2436

  2. Physical insight into ultra-shallow junction formation through atomistic modeling

    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 253, Núm. 1-2, pp. 41-45


  1. Simulation analysis of boron pocket deactivation in NMOS transistors with SPER junctions

    2005 Spanish Conference on Electron Devices, Proceedings