Centre
ESCUELA DE INGENIERIA INFORMATICA (VA)
Communications dans un congrès (3) Publications auxquelles un chercheur a participé
1994
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A STUDY OF CHANNELING AND INDUCED DAMAGE IN BORON-IMPLANTED SILICON
DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS AND DEVICES
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Knowledge based approach to fault detection and diagnosis in industrial processes: A case study
Proceedings of 1994 IEEE International Symposium on Industrial Electronics (ISIE'94)
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Knowledge based diagnosis: dealing with fault modes and temporal constraints
IECON Proceedings (Industrial Electronics Conference)