ESCUELA DE INGENIERIA INFORMATICA (VA)

1998

1. A model and a visual query language for structured text

   Proceedings - String Processing and Information Retrieval: A South American Symposium, SPIRE 1998

2. Accuracy of stark broadening calculations for ionic emitters

   Physical Review Letters, Vol. 81, Núm. 25, pp. 5568-5571

3. CoMA-BC: A cache only memory architecture multicomputer for non-hierarchical common bus networks

   Proceedings of the 6th Euromicro Workshop on Parallel and Distributed Processing, PDP 1998

4. Conductance transients study of slow traps in Al/SiNx : H/Si and Al/SiNx : H/InP metal-insulator-semiconductor structures

   ELECTRICALLY BASED MICROSTRUCTURAL CHARACTERIZATION II

5. Conductance transients study of slow traps in Al/SiNx:H/Si and Al/SiNx:H/InP metal-insulator-semiconductor structures

   Materials Research Society Symposium - Proceedings

6. Curso de C bajo Unix

   Valladolid : Secretariado de Publicaciones e Intercambio Científico, Universidad de Valladolid, 1998

7. Cálculo diferencial en Rn: teoría y ejercicios

   Boecillo (Valladolid) : C. Marijuán, 1998

8. Deposition of SiNx: H thin films by the electron cyclotron resonance and its application to Al/SiNx:H/Si structures

   Journal of Applied Physics, Vol. 83, Núm. 1, pp. 332-338

9. Desarrollo de aplicaciones software que faciliten la asimilación de los contenidos teóricos de las asignaturas

   VI Congreso universitario de innovación educativa en las enseñanzas técnicas: comunicaciones y ponencias. Las Palmas de Gran Canaria. 9, 10 y 11 de septiembre de 1998

10. Electrical characterization of deep levels existing in Mg-Si- and Mg-P-Si-implanted p+n InP junctions

    Semiconductor Science and Technology, Vol. 13, Núm. 4, pp. 389-393

11. Fast recognition of postures for a simplified three-fingered artificial hand

    Proceedings of the IEEE International Conference on Systems, Man and Cybernetics

12. Good quality Al/SiNx:H/InP metal-insulator-semiconductor devices obtained with electron cyclotron resonance plasma method

    Journal of Applied Physics, Vol. 83, Núm. 1, pp. 600-603

13. Knowledge based process control supervision and diagnosis: The AEROLID approach

    Expert Systems with Applications, Vol. 14, Núm. 3, pp. 371-383

14. More about system-level validity in Eiffel

    JOOP - Journal of Object-Oriented Programming, Vol. 11, Núm. 4, pp. 40-48

15. On line industrial diagnosis: An attempt to apply artificial intelligence techniques to process control

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

16. Phonetic classification in spanish using a hierarchy of specialized anns

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)