Département
Electricidad y Electrónica
Publications (15) Publications auxquelles un chercheur a participé
2012
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A 1.2 V, 130 nm CMOS parallel continuous-time ΣΔ ADC for OFDM UWB receivers
Microelectronics Journal, Vol. 43, Núm. 4, pp. 288-297
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Codiffusion of phosphorus and carbon in preamorphized ultrashallow junctions
Electrochemical and Solid-State Letters, Vol. 15, Núm. 6
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Effect of silicon on the cast macrostructure of Fe-Si alloys
Materials Research Society Symposium Proceedings
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Electrical Characterization of High-K Dielectric Gates for Microelectronic Devices
Dielectric Material
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Electrical properties of intermediate band (IB) silicon solar cells obtained by titanium ion implantation
AIP Conference Proceedings
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Implementation of absorbing boundary conditions based on the second-order one-way wave equation in the LOD- and the ADI-FDTD methods
IEEE Antennas and Wireless Propagation Letters, Vol. 11, pp. 981-983
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Kinetic Monte Carlo simulation of dopant-defect systems under submicrosecond laser thermal processes
AIP Conference Proceedings
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Kinetic Monte Carlo simulations for transient thermal fields: Computational methodology and application to the submicrosecond laser processes in implanted silicon
Physical Review E - Statistical, Nonlinear, and Soft Matter Physics, Vol. 86, Núm. 3
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Micromagnetic simulations using Graphics Processing Units
Journal of Physics D: Applied Physics, Vol. 45, Núm. 32
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Molecular dynamics simulation of the regrowth of nanometric multigate Si devices
Journal of Applied Physics, Vol. 111, Núm. 3
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Molecular dynamics simulations of damage production by thermal spikes in Ge
Journal of Applied Physics, Vol. 111, Núm. 3
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Preface: 19th International Conference on Ion Implantation Technology
AIP Conference Proceedings
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Synthesis, magnetic and dielectric properties of ErNi doped Sr-hexaferrite nanomaterials for applications in High density recording media and microwave devices
Journal of Magnetism and Magnetic Materials, Vol. 324, Núm. 1, pp. 15-19
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Temperature effect on damage generation mechanisms during ion implantation in Si. A classical molecular dynamics study
AIP Conference Proceedings
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The use of companion harmonic circuit models for transient analysis and periodic steady state initialization in electrical networks with nonlinearities
Electric Power Systems Research, Vol. 93, pp. 46-53