Application of high-resolution X-ray diffractometry to the structural study of epitaxial multilayers on novel index surfaces

1. Sanz-Hervés, A.
2. Garrido, M.
3. Aguilar, M.
4. Sacedón, A.
5. Sanchez-Rojas, J.L.
6. Calleja, E.
7. Muñoz, E.
8. Villar, C.
9. Abril, E.J.
10. López, M.