Effect of interlayer trapping and detrapping on the determination of interface state densities on high-k dielectric stacks

  1. Dueñas, S.
  2. Castán, H.
  3. García, H.
  4. Gómez, A.
  5. Bailón, L.
  6. Toledano-Luque, M.
  7. Del Prado, A.
  8. Mártil, I.
  9. González-Díaz, G.
Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09

ISBN: 9781424428397

Year of publication: 2009

Pages: 1-4

Type: Conference paper

DOI: 10.1109/SCED.2009.4800414 GOOGLE SCHOLAR