High resolution X-ray diffraction, X-ray multiple diffraction and cathodoluminescence as combined tools for the characterization of substrates for epitaxy: The ZnO case

1. Martínez-Tomás, M.C.
2. Hortelano, V.
3. Jiménez, J.
4. Wang, B.
5. Muñoz-Sanjosé, V.