Importance of the choice of the profile model for a p-n junction in the location of deep levels

  1. Jimenez-Tejada, J.A.
  2. Lopez-Villanueva, J.A.
  3. Cartujo, P.
  4. Vicente, J.
  5. Carceller, J.E.
Revue:
Journal of Electronic Materials

ISSN: 0361-5235 1543-186X

Année de publication: 1992

Volumen: 21

Número: 9

Pages: 883-886

Type: Article

DOI: 10.1007/BF02665544 GOOGLE SCHOLAR