A new fault diagnosis algorithm that improves the integration of fault detection and isolation
- Puig, V.
- Schmid, F.
- Quevedo, J.
- Pulido, B.
Proceedings:
Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
ISBN: 9780780395688
Year of publication: 2005
Volume: 2005
Pages: 3809-3814
Type: Conference paper