Modeling of damage generation mechanisms in silicon at energies below the displacement threshold

  1. Santos, I.
  2. Marqués, L.A.
  3. Pelaz, L.
Revue:
Physical Review B - Condensed Matter and Materials Physics

ISSN: 1098-0121,  1550-235X

Année de publication: 2006

Volumen: 74

Número: 17

Type: Article

DOI: 10.1103/PHYSREVB.74.174115 GOOGLE SCHOLAR
La source de données: Scopus