Atomistic modeling and physical comprehension of the effects of implant dose rate on boron activation in pMOSFET S/D
- Singer, J.
- Salvetti, F.
- Kaeppelin, V.
- Wacquant, F.
- Cagnat, N.
- Jaraiz, M.
- Castrillo, P.
- Rubio, E.
- Poncet, A.
Actes de conférence:
ESSDERC 2007 - Proceedings of the 37th European Solid-State Device Research Conference
ISBN: 9781424411238
Année de publication: 2007
Volumen: 2007
Pages: 338-341
Type: Communication dans un congrès