A study of tunneling assisted charge exchange on the inner interface of high-k dielectric stacks

  1. Castán, H.
  2. García, H.
  3. Gómez, A.
  4. Dueñas, S.
  5. Bailón, L.
Actes de conférence:
Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011

ISBN: 9781424478637

Année de publication: 2011

Type: Communication dans un congrès

DOI: 10.1109/SCED.2011.5744210 GOOGLE SCHOLAR
La source de données: Scopus