Decentralized and Dynamic Fault Detection Using PCA and Bayesian Inference

  1. Sanchez-Fernandez, A.
  2. Fuente, M.J.
  3. Sainz-Palmero, G.I.
Proceedings:
IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

ISSN: 1946-0759,  1946-0740

ISBN: 9781538671085

Year of publication: 2018

Volume: 2018-September

Pages: 800-807

Type: Conference paper

DOI: 10.1109/ETFA.2018.8502656 GOOGLE SCHOLAR lock_openUVADOC editor
Data source: Scopus