Programming pulse width assessment for reliable and low-energy endurance performance in al:Hfo2-based rram arrays

  1. Pérez, E.
  2. Ossorio, Ó.G.
  3. Dueñas, S.
  4. Castán, H.
  5. García, H.
  6. Wenger, C.
Revue:
Electronics (Switzerland)

ISSN: 2079-9292

Année de publication: 2020

Volumen: 9

Número: 5

Type: Article

DOI: 10.3390/ELECTRONICS9050864 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus