Apparent temperature verses true temperature of silicon crystals as a function of their thickness using infrared measurements

  1. Smither, R.K.
  2. Fernandez, P.B.
Revista:
Nuclear Inst. and Methods in Physics Research, A

ISSN: 0168-9002

Ano de publicación: 1994

Volume: 347

Número: 1-3

Páxinas: 640-643

Tipo: Artigo

DOI: 10.1016/0168-9002(94)91963-1 GOOGLE SCHOLAR
Fonte de datos: Scopus