Optical admittance spectroscopy: A new method for deep level characterization

  1. Dueñas, S.
  2. Jaraiz, M.
  3. Vicente, J.
  4. Rubio, E.
  5. Bailón, L.
  6. Barbolla, J.
Revue:
Journal of Applied Physics

ISSN: 0021-8979

Année de publication: 1987

Volumen: 61

Número: 7

Pages: 2541-2545

Type: Article

DOI: 10.1063/1.337930 GOOGLE SCHOLAR
La source de données: Scopus