Electron thermal emission rates of nickel centers in silicon

  1. Jaraiz, M.
  2. Dueñas, S.
  3. Vicente, J.
  4. Bailón, L.
  5. Barbolla, J.
Journal:
Solid State Electronics

ISSN: 0038-1101

Year of publication: 1986

Volume: 29

Issue: 9

Pages: 883-884

Type: Article

DOI: 10.1016/0038-1101(86)90008-0 GOOGLE SCHOLAR
Data source: Scopus