Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation

1. Santos, I.
2. Ruiz, M.
3. Aboy, M.
4. Marqués, L.A.
5. López, P.
6. Pelaz, L.

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DOI: 10.1007/S11664-018-6140-X GOOGLE SCHOLAR lock_openUVADOC editor

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