Determination of three-dimensional deep level defect distribution by capacitance-voltage transient technique (CVTT)

  1. Duenas, S
  2. Pinacho, R
  3. Quintanilla, L
  4. Castan, E
  5. Barbolla, J
Büchersammlung:
DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1995
  1. Mickleson, AR (coord.)

ISSN: 0951-3248

ISBN: 0-7503-0372-7

Datum der Publikation: 1996

Ausgabe: 149

Seiten: 121-126

Kongress: Defect Recognition and Image Processing in Semiconductors 1995 Conference (DRIP VI)

Art: Konferenz-Beitrag