Artifacts-free fourier ptychographic microscopy using a misaligned setup

  1. Bianco, V.
  2. Mandracchia, B.
  3. Běhal, J.
  4. Barone, D.
  5. Memmolo, P.
  6. Ferraro, P.
Proceedings:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 1996-756X,  0277-786X

ISBN: 9781510644069

Year of publication: 2021

Volume: 11786

Type: Conference paper

DOI: 10.1117/12.2592550 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus