Electrical Characterization of High-K Dielectric Gates for Microelectronic Devices

  1. Duenas, Salvador 1
  2. Castan, Helena 1
  3. Garcia, Hector 1
  4. Bailon, Luis 1
  1. 1 Universidad de Valladolid
    info

    Universidad de Valladolid

    Valladolid, España

    ROR https://ror.org/01fvbaw18

Liburua:
Dielectric Material

Argitalpen urtea: 2012

Mota: Liburuko kapitulua

DOI: 10.5772/50399 GOOGLE SCHOLAR lock_openSarbide irekia editor