Publications by the researcher in collaboration with LUIS ALBERTO MARQUES CUESTA (5)

2018

  1. I ON Degradation in Si Devices in Harsh Radiation Environments: Modeling of Damage-Dopant Interactions

    Proceedings of the 2018 12th Spanish Conference on Electron Devices, CDE 2018

2006

  1. Atomistic modeling of dopant implantation, diffusion, and activation

    Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol. 24, Núm. 5, pp. 2432-2436

  2. Physical insight into ultra-shallow junction formation through atomistic modeling

    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 253, Núm. 1-2, pp. 41-45

2005

  1. Damage buildup model with dose rate and temperature dependence

    2005 Spanish Conference on Electron Devices, Proceedings

  2. Simulation analysis of boron pocket deactivation in NMOS transistors with SPER junctions

    2005 Spanish Conference on Electron Devices, Proceedings