MARIA JESUS DE LA
FUENTE APARICIO
CATEDRATICOS DE UNIVERSIDAD
PASTORA ISABEL
VEGA CRUZ
Investigadora en el periodo 1989-1995
Publicaciones en las que colabora con PASTORA ISABEL VEGA CRUZ (13)
2024
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Fault-Tolerant Model Predictive Control Applied to a Sewer Network
Applied Sciences (Switzerland), Vol. 14, Núm. 12
2016
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Control predictivo no lineal tolerante a fallos en una planta de tratamiento de aguas residuales
Actas de las XXXVII Jornadas de Automática: Madrid. 7, 8 y 9 de septiembre de 2016
2012
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Fault detection in a wastewater treatment plant based on neural networks and PCA
2012 20th Mediterranean Conference on Control and Automation, MED 2012 - Conference Proceedings
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Monitorización de controladores predictivos
Actas de las XXXIII Jornadas de Automática: Vigo, 5 al 7 de Septiembre de 2012 (Universidade de Vigo)
2009
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Fault detection and diagnosis using multivariate statistical techniques in a wastewater treatment plant
IFAC Proceedings Volumes (IFAC-PapersOnline)
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Fault detection in processes with multiple operation modes using switch-PCA and analysis of grade transitions
2009 European Control Conference, ECC 2009
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Model predictive control tuning considering l1 norm for disturbance rejection
2009 European Control Conference, ECC 2009
2004
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Recurrent neuro-fuzzy modeling of a wastewater treatment plant
European Journal of Control, Vol. 10, Núm. 1, pp. 84-96
2001
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Recurrent neuro-fuzzy modeling of a biotechnological process
2001 European Control Conference, ECC 2001
1999
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Neural networks applied to fault detection of a biotechnological process
Engineering Applications of Artificial Intelligence, Vol. 12, Núm. 5, pp. 569-584
1996
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Fault detection in a real wastewater plant using parameter-estimation techniques
Control Engineering Practice, Vol. 4, Núm. 8, pp. 1089-1098
1995
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A comparison of identification algorithms for rapidly time-varying parameters on a real process
ADAPTIVE SYSTEMS IN CONTROL AND SIGNAL PROCESSING 1995
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Neural networks based approach for fault detection and diagnosis: application to a real process
IEEE Conference on Control Applications - Proceedings