JUAN JOSE
BARBOLLA SANCHO
Investigador en el periodo 1983-2005
Universitat Autònoma de Barcelona
Barcelona, EspañaPublicaciones en colaboración con investigadores/as de Universitat Autònoma de Barcelona (4)
1995
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Ability of capacitance–voltage transient technique to study spatial distribution and electric field dependence of emission properties of deep levels in semiconductors
Materials Science and Technology (United Kingdom), Vol. 11, Núm. 10, pp. 1074-1078
1993
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Electrical characterization of MOS structures fabricated on SF6 and SF6 + C2CIF5 reactive ion etched silicon
Nuclear Inst. and Methods in Physics Research, B, Vol. 80-81, Núm. PART 2, pp. 1362-1366
1992
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A study of metal-oxide-semiconductor capacitors fabricated on SF 6 and SF6+Cl2 reactive-ion-etched Si
Journal of Applied Physics, Vol. 71, Núm. 6, pp. 2710-2716
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Characterization of the Electrical Damage due to Polysilicon RIE(SF6+ CL2Plasma) Etching
Journal of the Electrochemical Society, Vol. 139, Núm. 1, pp. 193-195