LUIS ALBERTO
BAILON VEGA
Investigador en el periodo 1981-2016
Universitat Autònoma de Barcelona
Barcelona, EspañaPublicaciones en colaboración con investigadores/as de Universitat Autònoma de Barcelona (5)
2016
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Electrical properties and nanoresistive switching of Ni-HfO2-Si capacitors
ECS Transactions
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Study from cryogenic to high temperatures of the high- and low-resistance-state currents of ReRAM Ni-HfO2-Si capacitors
IEEE Transactions on Electron Devices, Vol. 63, Núm. 5, pp. 1877-1883
2015
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Conduction and stability of holmium titanium oxide thin films grown by atomic layer deposition
Thin Solid Films, Vol. 591, pp. 55-59
2011
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Electrical characterization of high-k based metal-insulator-semiconductor structures with negative resistance effect when using Al2O 3 and nanolaminated films deposited on p-Si
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
1992
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Characterization of the Electrical Damage due to Polysilicon RIE(SF6+ CL2Plasma) Etching
Journal of the Electrochemical Society, Vol. 139, Núm. 1, pp. 193-195