Interuniversity Microelectronics Centre-ko ikertzaileekin lankidetzan egindako argitalpenak (3)

2021

  1. Standards for the Characterization of Endurance in Resistive Switching Devices

    ACS Nano, Vol. 15, Núm. 11, pp. 17214-17231

2017

  1. Thermal characterization of polycrystalline diamond thin film heat spreaders grown on GaN HEMTs

    Applied Physics Letters, Vol. 111, Núm. 4

2008

  1. Atomistic modeling of impurity ion implantation in ultra-thin-body Si devices

    Technical Digest - International Electron Devices Meeting, IEDM