Física Aplicada
Departamento
MARIA INMACULADA DE LA
ROSA GARCIA
Investigadora no período 1992-2021
Publicacións nas que colabora con MARIA INMACULADA DE LA ROSA GARCIA (13)
2017
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Optogalvanic spectroscopy applied to the study of hollow cathode discharges devices
XXIII International Conference on Spectral Line Shapes
2015
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Como controlar la emisión de un láser en un solo modo longitudinal
Óptica pura y aplicada, Vol. 48, Núm. 2, pp. 141-144
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Cristales no lineales: ¿son mágicos?
Óptica pura y aplicada, Vol. 48, Núm. 2, pp. 135-139
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Optogalvanic spectroscopy measurements of the electric field strength in a hydrogen glow discharge
Proceedings of Frontiers in Optics 2015, FIO 2015
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Optogalvanic spectroscopy measurements of the electric field strength in a hydrogen glow discharge
Optics InfoBase Conference Papers
2014
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Analysis of the measured 1S-2S Stark spectra of hydrogen isotopes used for E-field strength determination in a hollow cathode discharge
Journal of Physics: Conference Series
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Calculation of the spatial resolution in two-photon absorption spectroscopy applied to plasma diagnosis
Journal of Applied Physics, Vol. 116, Núm. 13
2013
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Characterization of the spatial resolution in two-photon spectroscopic techniques used for plasma diagnostics
Proceedings of SPIE - The International Society for Optical Engineering
2011
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Measurements of two-photon absorption cross-section of Xe for laser spectroscopic techniques calibration
Journal of Physics: Conference Series
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Research areas of the Plasma Spectroscopy Group at the University of Valladolid
Óptica pura y aplicada, Vol. 44, Núm. 3, pp. 433-445
2008
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Determination of two-photon absorption cross-section of noble gases for calibration of laser spectroscopic techniques
AIP Conference Proceedings
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Local electric field strength in a hollow cathode determined by stark splitting of the 2S level of hydrogen isotopes by optogalvanic spectroscopy
AIP Conference Proceedings
1999
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Research lines of the Optics Department in University of Valladolid
Proceedings of SPIE - The International Society for Optical Engineering, Vol. 3572, pp. 588-592