Lattice damage study of implanted InGaAs by means of Raman spectroscopy
- Hernández, S.
- Marcos, B.
- Cuscó, R.
- Blanco, N.
- González-Díaz, G.
- Artús, L.
Revue:
Journal of Luminescence
ISSN: 0022-2313
Année de publication: 2000
Volumen: 87
Pages: 721-723
Type: Article