Characterisation of semiconductor structures by high resolution X-ray diffraction

  1. Sanz-Hervás, A.
  2. Abril, E.J.
  3. Paz, D.I.
  4. de Benito, G.
  5. Llorente, C.
  6. Aguilar, M.
  7. López, M.
Journal:
Materials Science and Technology (United Kingdom)

ISSN: 1743-2847,  0267-0836

Year of publication: 1995

Volume: 11

Issue: 1

Pages: 72-79

Type: Article

DOI: 10.1179/MST.1995.11.1.72 GOOGLE SCHOLAR
Data source: Scopus