Avalanche breakdown of high-voltage p-n junctions of SiC

  1. Pelaz, L.
  2. Orantes, J.L.
  3. Vicente, J.
  4. Bailón, L.
  5. Barbolla, J.
Revue:
Microelectronics Journal

ISSN: 0026-2692

Année de publication: 1996

Volumen: 27

Número: 1

Pages: 43-51

Type: Article

DOI: 10.1016/0026-2692(95)00056-9 GOOGLE SCHOLAR
La source de données: Scopus