MicroRaman and Hall effect study of n-type bulk 4H-SiC
- Chafai, M.
- Jiménez, J.
- Martin, E.
- Mitchel, W.C.
- Saxler, A.
- Perrin, R.
Aktak:
Materials Science Forum
ISSN: 0255-5476
Argitalpen urtea: 2000
Alea: 338
Mota: Artikulua