Experimental observations of temperature-dependent flat band voltage transients on high-k dielectrics

  1. Dueñas, S.
  2. Castán, H.
  3. García, H.
  4. Bailón, L.
  5. Kukli, K.
  6. Hatanpää, T.
  7. Ritala, M.
  8. Leskelä, M.
Journal:
Microelectronics Reliability

ISSN: 0026-2714

Year of publication: 2007

Volume: 47

Issue: 4-5 SPEC. ISS.

Pages: 653-656

Type: Article

DOI: 10.1016/J.MICROREL.2007.01.080 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus