From point defects to dislocation loops: A comprehensive modelling framework for self-interstitial defects in silicon

  1. Martin-Bragado, I.
  2. Avci, I.
  3. Zographos, N.
  4. Jaraiz, M.
  5. Castrillo, P.
Solid-State Electronics

ISSN: 0038-1101

Year of publication: 2008

Volume: 52

Issue: 9

Pages: 1430-1436

Type: Article

DOI: 10.1016/J.SSE.2008.04.027 GOOGLE SCHOLAR