Carrier mobility degradation in highly B-doped junctions

  1. Aboy, M.
  2. Pelaz, L.
  3. López, P.
  4. Bruno, E.
  5. Mirabella, S.
Proceedings:
Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09

ISBN: 9781424428397

Year of publication: 2009

Pages: 34-37

Type: Conference paper

DOI: 10.1109/SCED.2009.4800423 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus