Carrier mobility degradation in highly B-doped junctions

  1. Aboy, M.
  2. Pelaz, L.
  3. López, P.
  4. Bruno, E.
  5. Mirabella, S.
Aktak:
Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09

ISBN: 9781424428397

Argitalpen urtea: 2009

Orrialdeak: 34-37

Mota: Biltzar ekarpena

DOI: 10.1109/SCED.2009.4800423 GOOGLE SCHOLAR
Datuen iturria: Scopus