A Big Data Architecture for Fault Prognostics of Electronic Devices: Application to Power MOSFETs

1. Alonso-Gonzalez, C.J.
2. Pulido, B.
3. Carton, M.
4. Bregon, A.

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DOI: 10.1109/ACCESS.2019.2929111 GOOGLE SCHOLAR lock_openOpen access editor

Data source: Scopus