A Big Data Architecture for Fault Prognostics of Electronic Devices: Application to Power MOSFETs

  1. Alonso-Gonzalez, C.J.
  2. Pulido, B.
  3. Carton, M.
  4. Bregon, A.
Revue:
IEEE Access

ISSN: 2169-3536

Année de publication: 2019

Volumen: 7

Pages: 102160-102173

Type: Article

DOI: 10.1109/ACCESS.2019.2929111 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus