I ON Degradation in Si Devices in Harsh Radiation Environments: Modeling of Damage-Dopant Interactions
- López, P.
- Aboy, M.
- Muñoz, I.
- Santos, I.
- Marqués, L.A.
- Couso, C.
- Ullán, M.
- Pelaz, L.
Proceedings:
Proceedings of the 2018 12th Spanish Conference on Electron Devices, CDE 2018
ISBN: 9781538657799
Year of publication: 2018
Type: Conference paper