I ON Degradation in Si Devices in Harsh Radiation Environments: Modeling of Damage-Dopant Interactions

  1. López, P.
  2. Aboy, M.
  3. Muñoz, I.
  4. Santos, I.
  5. Marqués, L.A.
  6. Couso, C.
  7. Ullán, M.
  8. Pelaz, L.
Actes de conférence:
Proceedings of the 2018 12th Spanish Conference on Electron Devices, CDE 2018

ISBN: 9781538657799

Année de publication: 2018

Type: Communication dans un congrès

DOI: 10.1109/CDE.2018.8596953 GOOGLE SCHOLAR
La source de données: Scopus