Thermomechanical degradation of single and multiple quantum well AlGaAs/GaAs laser diodes

  1. Souto, J.
  2. Pura, J.L.
  3. Torres, A.
  4. Jiménez, J.
Journal:
Microelectronics Reliability

ISSN: 0026-2714

Year of publication: 2017

Volume: 76-77

Pages: 588-591

Type: Article

DOI: 10.1016/J.MICROREL.2017.07.005 GOOGLE SCHOLAR lock_openUVADOC editor