Catastrophic optical damage of high power InGaAs/AlGaAs laser diodes

  1. Souto, J.
  2. Pura, J.L.
  3. Torres, A.
  4. Jiménez, J.
  5. Bettiati, M.
  6. Laruelle, F.J.
Revue:
Microelectronics Reliability

ISSN: 0026-2714

Année de publication: 2016

Volumen: 64

Pages: 627-630

Type: Article

DOI: 10.1016/J.MICROREL.2016.07.038 GOOGLE SCHOLAR lock_openUVADOC editor