Study of TiN/Ti/HfO2/W resistive switching devices: characterization and modeling of the set and reset transitions using an external capacitor discharge
- García, H.
- Jiménez-Molinos, F.
- Vinuesa, G.
- González, M.B.
- Roldán, J.B.
- Miranda, E.
- Campabadal, F.
- Castán, H.
- Dueñas, S.
Journal:
Solid-State Electronics
ISSN: 0038-1101
Year of publication: 2022
Volume: 194
Type: Article
DOI:
10.1016/J.SSE.2022.108385
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HANDLE:
https://hdl.handle.net/10324/58643
UVaDOC. Repositorio Documental de la Universidad de Valladolid:
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