Determination of three-dimensional deep level defect distribution by capacitance-voltage transient technique (CVTT)
- Duenas, S
- Pinacho, R
- Quintanilla, L
- Castan, E
- Barbolla, J
- Mickleson, AR (coord.)
ISSN: 0951-3248
ISBN: 0-7503-0372-7
Año de publicación: 1996
Volumen: 149
Páginas: 121-126
Congreso: Defect Recognition and Image Processing in Semiconductors 1995 Conference (DRIP VI)
Tipo: Aportación congreso