Photocurrent mapping of Fe-doped semi-insulating InP
- Jimenez, J
- Avella, M
- Alvarez, A
- Gonzalez, M
- Fornari, R
- Mickleson, AR (coord.)
ISSN: 0951-3248
ISBN: 0-7503-0372-7
Datum der Publikation: 1996
Ausgabe: 149
Seiten: 269-274
Kongress: Defect Recognition and Image Processing in Semiconductors 1995 Conference (DRIP VI)
Art: Konferenz-Beitrag