Photocurrent mapping of Fe-doped semi-insulating InP

  1. Jimenez, J
  2. Avella, M
  3. Alvarez, A
  4. Gonzalez, M
  5. Fornari, R
Colección de libros:
DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1995
  1. Mickleson, AR (coord.)

ISSN: 0951-3248

ISBN: 0-7503-0372-7

Ano de publicación: 1996

Volume: 149

Páxinas: 269-274

Congreso: Defect Recognition and Image Processing in Semiconductors 1995 Conference (DRIP VI)

Tipo: Achega congreso

GOOGLE SCHOLAR
Fonte de datos: WoS