Influence of Large Periods of DC Current Injection in c-Si Photovoltaic Panels

1. Moretón Fernández, Ángel
2. Gallardo Saavedra, Sara
3. Jimenez Martín, Marta
4. Gómez Alonso, Victor
5. Hernandez Callejo, Luis
6. Morales Aragonés, Jose Ignacio
7. Martínez Sacristán, Óscar
8. Gonzalez Rebollo, Miguel Angel
9. Jimenez López, Juan

Exportar

Exportar

×

MLA

modern-language-association

APA

apa

Chicago

chicago-fullnote-bibliography

Harvard

harvard-cite-them-right

Vancouver

vancouver-author-date

---

RIS BibTex

Exportar

×

El documento no se puede exportar porque pertenece a otro portal.

Texto completo

lock_openUVADOC externo lock_openUVADOC externo

DOI: 10.4229/EUPVSEC20192019-4AV.1.38 GOOGLE SCHOLAR lock_openUVADOC editor

Resumen

Nowadays, electroluminescence imaging (Eli) appears as an emerging technique in the maintenance ofphotovoltaic (PV) plants. There is a concern about how the current injection needed in ELi measurements can affect the PV modules service life, and how these periodical inspections can affect the long term life of the modules. In order to give a practical answer to this problem, a series of tests consisting of long periods of current injection on several monocrystalline silicon modules has been carried out. The modules tested had already fulfilled their useful life and present multiple defects. In order to analyze how the current injection affects the state of the module, images of infrared thermography (IRT) and ELi were acquired during the current injection period. The subsequent analysis of these images shows only a small effect during the heating period in the EL intensity results at the beginning of each test, not affecting the module performance.