Influence of Large Periods of DC Current Injection in c-Si Photovoltaic Panels

  1. Moretón Fernández, Ángel
  2. Gallardo Saavedra, Sara
  3. Jimenez Martín, Marta
  4. Gómez Alonso, Victor
  5. Hernandez Callejo, Luis
  6. Morales Aragonés, Jose Ignacio
  7. Martínez Sacristán, Óscar
  8. Gonzalez Rebollo, Miguel Angel
  9. Jimenez López, Juan
Proceedings:
Proceedings of the 36th European Photovoltaic Solar Energy Conference and Exhibition

ISBN: 3-936338-60-4

Year of publication: 2019

Type: Conference paper

DOI: 10.4229/EUPVSEC20192019-4AV.1.38 GOOGLE SCHOLAR lock_openUVADOC editor

Sustainable development goals

Abstract

Nowadays, electroluminescence imaging (Eli) appears as an emerging technique in the maintenance ofphotovoltaic (PV) plants. There is a concern about how the current injection needed in ELi measurements can affect the PV modules service life, and how these periodical inspections can affect the long term life of the modules. In order to give a practical answer to this problem, a series of tests consisting of long periods of current injection on several monocrystalline silicon modules has been carried out. The modules tested had already fulfilled their useful life and present multiple defects. In order to analyze how the current injection affects the state of the module, images of infrared thermography (IRT) and ELi were acquired during the current injection period. The subsequent analysis of these images shows only a small effect during the heating period in the EL intensity results at the beginning of each test, not affecting the module performance.