Electrical analysis of logical complexity: an exploratory eeg study of logically valid/invalid deducive inference
- Salto, F.
- Requena, C.
- Alvarez-Merino, P.
- Rodríguez, V.
- Poza, J.
- Hornero, R.
ISSN: 2198-4026, 2198-4018
Datum der Publikation: 2023
Ausgabe: 10
Nummer: 1
Art: Artikel