Effects of the voltage ramp rate on the conduction characteristics of HfO2-based resistive switching devices
- García, H.
- Vinuesa, G.
- García-Ochoa, E.
- Aguirre, F.L.
- González, M.B.
- Jiménez-Molinos, F.
- Campabadal, F.
- Roldán, J.B.
- Miranda, E.
- Dueñas, S.
- Castán, H.
ISSN: 1361-6463, 0022-3727
Année de publication: 2023
Volumen: 56
Número: 36
Type: Article