Guest Editorial: Machine learning applied to quality and security in software systems

  1. Gao, H.
  2. Hussain, W.
  3. Durán Barroso, R.J.
  4. Arshad, J.
  5. Yin, Y.
Journal:
IET Software

ISSN: 1751-8814 1751-8806

Year of publication: 2023

Volume: 17

Issue: 4

Pages: 345-347

Type: Editorial

DOI: 10.1049/SFW2.12141 GOOGLE SCHOLAR lock_openOpen access editor

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