Guest Editorial: Machine learning applied to quality and security in software systems
- Gao, H.
- Hussain, W.
- Durán Barroso, R.J.
- Arshad, J.
- Yin, Y.
ISSN: 1751-8814, 1751-8806
Year of publication: 2023
Volume: 17
Issue: 4
Pages: 345-347
Type: Editorial