2014

1. Analysis of the reduction of tensile stress by post-growth annealing methods in multicrystalline silicon wafers produced by the RST process

   Physica Status Solidi (C) Current Topics in Solid State Physics, Vol. 11, Núm. 11-12, pp. 1640-1643

2. Raman study of multicrystalline silicon wafers produced by the RST process

   Acta Physica Polonica A